A00400 - SEMI A4 - Specification for the Automated Test Equipment Tester Event Messaging for Semiconductors (TEMS) StdTpc-Gallium Arsenide Further clarification may be required

Further clarification may be required between supplier and purchaser for the particular layers required

本スタンダードは，FPDカラーフィルターの偏光解消効果を測定するための実施方法を定めている。

この標準は測定したエッジプロファイルからこれらの特性を導出するための二つのテスト方法を包む。

SEMI S2-0706d (delayed revision)

The scope of this Standard is to define WJOBJ which represents WJ

A00400 - SEMI A4 - Specification for the Automated Test Equipment Tester Event Messaging for Semiconductors (TEMS) StdTpc-Gallium Arsenide Further clarification may be requiredNOTICE: The designation of SEMI A4 was updated during the 0821 publishing cycle to reflect the publication of SEMI A4. 1. 1 Purpose 1. 1 Semiconductor test operations involving automated test equipment (ATE) today are experiencing increasing use of data for real time data analysis and real time ATE input and control, to improve test yield, throughput, efficiency, and product quality. At the same time, test equipment and test operations around the