G08400 - SEMI G84 - Specification for Strip Map Protocol StdPbc-0220 This guide does not include

This guide does not include requirements for individual exhausted enclosures (e

This Standard specifies markers on FPD polarizing films

This Test Method is therefore destructive to the silicon wafer

while maintaining wafer quality

SEMI C35-0699 (first published - replaces SEMI C1

G08400 - SEMI G84 - Specification for Strip Map Protocol StdPbc-0220 This guide does not includeThe purpose of this specification is to provide definition that will enable the implementation of strip mapping throughout the assembly and test process. This document will enable standardization of the strip map format and execution method throughout the factory floor. This document describes the format and methods in which strip map information shall be formatted and used to transfer information about a strip to and from equipment using the SECS GEM