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Smarter Sensors, Smarter Fabs: AI at the Edge in Semiconductor Manufacturing StdPbc-0417 lower space requirement
Smarter Sensors, Smarter Fabs: AI at the Edge in Semiconductor Manufacturing StdPbc-0417 lower space requirement
$197.50
Description
lower space requirement
これは，パッケージのリードの抵抗を測定する際に用いられる装置，材料，および手順に関するものである。ここに述べる検査方法で測定可能なパッケージの1例として，ピングリッド（キャビティ下向きタイプ）パッケージを取りあげるが，本測定方法は他の形態のパッケージにも応用されうるものである。
In other cases
Current edition approved by the Japanese Regional Standards Committee on June 19
Indirect Contrast Measurement — This method requires three polarizers that have similar C
Smarter Sensors, Smarter Fabs: AI at the Edge in Semiconductor Manufacturing StdPbc-0417 lower space requirement
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